Low-Power Built-In Self-Test Techniques for Embedded SRAMs
نویسندگان
چکیده
منابع مشابه
Test planning for low-power built-in self test
Power consumption has become the most important issue in the design of integrated circuits. The power consumption during manufacturing or in-system test of a circuit can significantly exceed the power consumption during functional operation. The excessive power can lead to false test fails or can result in the permanent degradation or destruction of the device under test. Both effects can signi...
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ژورنال
عنوان ژورنال: VLSI Design
سال: 2007
ISSN: 1065-514X,1563-5171
DOI: 10.1155/2007/67019